Einband:
Set mit div. Artikeln (Set)
Autor:
Neil Weste, Neil H. E. Weste, David Money Harris
Erscheinungsdatum:
29.06.2024
Autorentext
David Money Harris Associate Professor of Engineering at Harvey Mudd College in Claremont, CA, holds a Ph.D. from Stanford University and S.B. and M.Eng. degrees from MIT. His research interests include CMOS VLSI design, microprocessors, and computer arithmetic. He holds a dozen patents, is the author of three other books in the field of digital design and three hiking guidebooks, and has designed chips at Sun Microsystems, Intel, Hewlett-Packard, and Evans & Sutherland. Neil Weste is a member of the faculty at the Department of Electronic Engineering, Macquarie University; Adjunct Professor of Electrical Engineering at The University of Adelaide; and Director, Engineering at Cisco’s Wireless Networking Business Unit. He is a Fellow of the IEEE for his contributions to custom IC design, and a peer elected member of the IEEE Solid State Circuits Society. In 1997 he cofounded Radiata Communications (with David Skellern) which designed the first chip sets for the IEEE 802.11a WLAN standard; in 2001 Radiata was acquired by Cisco. He has served as department head at Bell Laboratories; leader of design projects for Symbolics, Inc.; and as president of TLW, Inc., an IC engineering company that completed groundbreaking chip designs for companies such as North American Philips, Analog Devices, AT&T Microelectronics and Thomson Consumer Electronics.
Klappentext
For both introductory and advanced courses in VLSI design. Highly accessible to beginners, yet offers unparalleled breadth and depth for more experienced readers. The Fourth Edition of this authoritative, comprehensive textbook presents broad and in-depth coverage of the entire field of modern CMOS VLSI Design. The authors draw upon extensive industry and classroom experience to introduce today's most advanced and effective chip design practices. They present extensively updated coverage of every key element of VLSI design, and illuminate the latest design challenges with 65 nm process examples. This book contains unsurpassed circuit-level coverage, as well as a rich set of problems and worked examples that provide deep practical insight to readers at all levels. Please visit for access to all instructor and student resources, available at no additional cost.
Zusammenfassung
For both introductory and advanced courses in VLSI design, this authoritative, comprehensive textbook is highly accessible to beginners, yet offers unparalleled breadth and depth for more experienced readers. The Fourth Edition of CMOS VLSI Design: A Circuits and Systems perspective presents broad and in-depth coverage of the entire field of modern CMOS VLSI Design. The authors draw upon extensive industry and classroom experience to introduce today’s most advanced and effective chip design practices. They present extensively updated coverage of every key element of VLSI design, and illuminate the latest design challenges with 65 nm process examples. This book contains unsurpassed circuit-level coverage, as well as a rich set of problems and worked examples that provide deep practical insight to readers at all levels.
Inhalt
Chapter 1 Introduction
1.1 A Brief History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.2 Preview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1.3 MOS Transistors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1.4 CMOS Logic. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
1.4.1 The Inverter 9
1.4.2 The NAND Gate 9
1.4.3 CMOS Logic Gates 9
1.4.4 The NOR Gate 11
1.4.5 Compound Gates 11
1.4.6 Pass Transistors and Transmission Gates 12
1.4.7 Tristates 14
1.4.8 Multiplexers 15
1.4.9 Sequential Circuits 16
1.5 CMOS Fabrication and Layout. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
1.5.1 Inverter Cross-Section 19
1.5.2 Fabrication Process 20
1.5.3 Layout Design Rules 24
1.5.4 Gate Layouts 27
1.5.5 Stick Diagrams 28
1.6 Design Partitioning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
1.6.1 Design Abstractions 30
1.6.2 Structured Design 31
1.6.3 Behavioral, Structural, and Physical Domains 31
1.7 Example: A Simple MIPS Microprocessor. . . . . . . . . . . . . . . . . . . . . . . . . . . 33
1.7.1 MIPS Architecture 33
1.7.2 Multicycle MIPS Microarchitectures 34
1.8 Logic Design. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
1.8.1 Top-Level Interfaces 38
1.8.2 Block Diagrams 38
1.8.3 Hierarchy 40
1.8.4 Hardware Description Languages 40
1.9 Circuit Design. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
1.10 Physical Design. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
1.10.1 Floorplanning 45
1.10.2 Standard Cells 48
1.10.3 Pitch Matching 50
1.10.4 Slice Plans 50
1.10.5 Arrays 51
1.10.6 Area Estimation 51
1.11 Design Verification. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
1.12 Fabrication, Packaging, and Testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Summary and a Look Ahead 55
Exercises 57
Chapter 2 MOS Transistor Theory
2.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
2.2 Long-Channel I-V Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
2.3 C-V Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
2.3.1 Simple MOS Capacitance Models 68
2.3.2 Detailed MOS Gate Capacitance Model 70
2.3.3 Detailed MOS Diffusion Capacitance Model 72
2.4 Nonideal I-V Effects. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
2.4.1 Mobility Degradation and Velocity Saturation 75
2.4.2 Channel Length Modulation 78
2.4.3 Threshold Voltage Effects 79
2.4.4 Leakage 80
2.4.5 Temperature Dependence 85
2.4.6 Geometry Dependence 86
2.4.7 Summary 86
2.5 DC Transfer Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
2.5.1 Static CMOS Inverter DC Characteristics 88
2.5.2 Beta Ratio Effects 90
2.5.3 Noise Margin 91
2.5.4 Pass Transistor DC Characteristics 92
2.6 Pitfalls and Fallacies. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
Summary 94
Exercises 95
Chapter 3 CMOS Processing Technology
3.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
3.2 CMOS Technologies. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
3.2.1 Wafer Formation 100
3.2.2 Photolithography 101
3.2.3 Well and Channel Formation 103
3.2.4 Silicon Dioxide (SiO2) 105
3.2.5 Isolation 106
3.2.6 Gate Oxide 107
3.2.7 Gate and Source/Drain Formations 108
3.2.8 Contacts and Metallization 110
3.2.9 Passivation 112
3.2.10 Metrology 112
3.3 Layout Design Rules . . . . . . . . . . . . . …
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